• Supports card-level cascading to expand multi-port
• Supports FIFO test queue for high-speed testing
• Proven long-term test stability
• Supports automatic port extension, fixture embedding/de-embedding, segmented scanning, pulse mode, and switch time measurement
• Supports linear sweep, segmented sweep, multi-channel/multi-trace analysis, and diverse data format selection
• Calibration methods: OSL, TR, ER, SLOT, TRL, UT, electronic calibration
• Three form factors: USB module, PXIe board, desktop type
• Keysight-style operation interface